X-Strata920 Coating Thickness Analyser

SKU : #241

Benchtop microspot XRF analyzers| X-STRATA920

From Hitachi High-Tech

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from Al¹³ to U⁹² on the periodic table.

The X-Strata920 is designed to measure single-layer and multi-layer coatings- including alloyed layers- for both the electronics and metal finishing industries. Our in-house applications experts have optimised the X-Strata920 to ensure you get reliable, repeatable results for hundreds of applications including PCB surface finishes, connector coatings, corrosion resistance, decorative finishes, wear resistance, high temperature resistance and more.

Where every mil or micron counts, the X-Strata920 gives you the precision and reliable results you need.

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